MarSurf CD 140 AF (Contour measuring station)
MarSurf CD 140 AF – Spaceoptimized measuring station for production
With the new MarSurf CD 140 AF, Mahr has launched a new contour measuring device onto the market. Its probe system has a measuring range of up to 70 mm, with which the probe tips can be changed quickly and without tools – and all without recalibration.
MarSurf CD 140 AF makes fast and precise measurements possible. Thanks to its flexible workpiece holder, it is particularly easy
to handle and impresses with its great versatility.
Innovative technologies:
Fast axes
• High-speed measuring X-axis with 140 mm measuring range
• Positioning speeds up to 200 mm/s
• Reliable measurements thanks to once adjusted measuring setup
• Integrated, manual 25 mm TY axis
Unique probing system
• Tool-free, quick change of probe tips saves time when changing
to another measurement task –> no recalibration required
• Magnetic probe tip holder
• Measuring range up to 70 mm as standard
• Automatic probe force selection guarantees the correct sensing force when switching between several probes
• Very low measuring force from 4mN enables the use of particularly “filigree” probes, e.g. for small bores.
• Optional: Extension for roughness value determination
Innovative workpiece clamping system
• Flexible mounting plate with 25mm bore grid
• The combination of mounting plate and integrated 25 mm TY adjustment eliminates the need for an additional XY table
• Low workpiece design supports an advantageous short measuring loop, which has a positive effect on the measurement results
• The clamping device stand enables the flexible use of workpiece holders and easy positioning of workpieces in the correct measuring position.
| Order No. | 6269051 | 6269052 | 6269053 | 6269054 | |
|---|---|---|---|---|---|
| Type | CD 140 AF | ||||
| Versions | without PC | with PC | without PC, with roughness option |
without PC, with roughness option |
|
| Probe measuring range | mm | 70,0 | |||
| Table axis travel (TY) | mm | 25 | |||
| Straightness deviation | 0.8 μm / 60 mm, 1.00 μm / 130 mm | ||||
| Measuring force | N | 4 mN to 30 mN, software adjustable | |||
| Measuring speed | 0.1 mm/s to 10 mm/s | ||||
| Positioning speed | X: 0.1 mm/s to 200 mm/s | ||||
| Probe | Contour tracing system | ||||
| Dimensions H x W x D | mm | (D x W x H) 385 x 836 x 426 | |||
| Other | machine weight: 35 kg | ||||


